Latex film formation study by using photon reflection method

dc.authoridPEKCAN, Onder/0000-0002-0082-8209
dc.authorwosidPEKCAN, Onder/Y-3158-2018
dc.contributor.authorPekcan, Ö
dc.contributor.authorArda, E
dc.date.accessioned2024-06-12T11:19:37Z
dc.date.available2024-06-12T11:19:37Z
dc.date.issued2000
dc.departmentTrakya Üniversitesien_US
dc.description.abstractPhoton reflection method was used to monitor the evolution of transparency during film formation from latex particles. Latex films were prepared from Poly (methyl methacrylate) (PMMA) particles, which were annealed at elevated temperatures in various time intervals during which reflected photon intensity, I-rf was measured. I-rf first decreased and then increased as the annealing temperature is increased. Decrease in I-rf was explained with the void closure mechanism. Increase in I-rf against temperature was attributed to increase in crossing density at the junction surface. The void closure constant, B and the back and forth activation energy (Delta E-rf) were measured and found to be around 24 x 10(3) K and 49 kcal/mol respectively.en_US
dc.identifier.doi10.1002/1521-3900(200002)151:1<443
dc.identifier.endpage450en_US
dc.identifier.issn1022-1360
dc.identifier.startpage443en_US
dc.identifier.urihttps://doi.org/10.1002/1521-3900(200002)151:1<443
dc.identifier.urihttps://hdl.handle.net/20.500.14551/25281
dc.identifier.volume151en_US
dc.identifier.wosWOS:000086729100018en_US
dc.identifier.wosqualityQ3en_US
dc.indekslendigikaynakWeb of Scienceen_US
dc.language.isoenen_US
dc.publisherWiley-V C H Verlag Gmbhen_US
dc.relation.ispartofMacromolecular Symposiaen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectPolymer Colloidsen_US
dc.subjectAcrylic Laticesen_US
dc.subjectEnergy-Transferen_US
dc.subjectParticlesen_US
dc.subjectDiffusionen_US
dc.subjectEllipsometryen_US
dc.subjectFluorescenceen_US
dc.titleLatex film formation study by using photon reflection methoden_US
dc.typeArticleen_US

Dosyalar